Ellipsometry is a well-known non-destructive optical method for determing film thickness and optical properties. Imaging Ellipsometry combines the power of ellipsometry with microscopy and overcomes the limits of classical ellipsometers.
The Nanofilm Imaging Ellipsometers enable you to study the surface in three steps:
· generating high contrast image from the surface
· ellipsometry with highest lateral resolution (1µm)
· generating of 3D thickness maps
nanofilm_ep3sw
The next step forward in Imaging Ellipsometry with the nanofilm_ep3sw
nanofilm_ep3se
The nanofilm_ep3se is the only commercial available Imaging Spectroscopic Ellipsometer
nanofilm_ep3spr
Multi– Channel and Imaging Surface Plasmon Resonance Analyser
EP³ + AFM = SPEM
The SPEM is a combination of Imaging Ellipsometer based on Nanofilm’s EP³ and the scanning probe microscope ULTRA-Object
nanofilm_ep3 Accessories
For all our products we offer a large range of accessories.
nanofilm_ep3bam
The nanofilm_ep3bam is an ideal thin films imaging system. It is a completely "hands-off" computer-controlled system