Imaging Ellipsometry overcomes the limits of classical ellipsometers by determing film thickness and optical properties by combining nulling ellipsometry with microscopy. You receive ellipsometric high contrast images from the surface with highest lateral resolution down to 1µm. Spectroscopic ellipsometry enables you studying complex materials like polymer surfaces, graphene, monolayer, biosensors, proteins, colloids and many more.
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Single Wavelength Imaging Ellipsometry for investigation of structured ultra thin films
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Spectroscopic Imaging Ellipsometry for investigation of complex structured ultra thin films
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Brewster Angle Microscopy for investigation of ultra thin organic thin films
nanofilm accessories
A large range of accessories to fit the systems to your specific applications
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Reflection spectroscopy on the air-water interface
application package SPR
Multi– Channel and Imaging Surface Plasmon Resonance Analyser
application package AFM
atomic force microscopy combined with Imaging Ellipsometry